Towards formal abstraction, modeling, and analysis of Single Event Transients at RTL
暂无分享,去创建一个
[1] Liang Chen,et al. Formal Quantification of the Register Vulnerabilities to Soft Error in RTL Control Paths , 2015, J. Electron. Test..
[2] L. W. Massengill,et al. Single Event Transients in Digital CMOS—A Review , 2013, IEEE Transactions on Nuclear Science.
[3] Shobha Vasudevan,et al. Statistical guarantees of performance for MIMO designs , 2010, 2010 IEEE/IFIP International Conference on Dependable Systems & Networks (DSN).
[4] Mehdi Baradaran Tahoori,et al. Using Boolean satisfiability for computing soft error rates in early design stages , 2010, Microelectron. Reliab..
[5] Xiaoyu Song,et al. Multiway Decision Graphs for Automated Hardware Verification , 1997, Formal Methods Syst. Des..
[6] Marco Bozzano,et al. Efficient Analysis of Reliability Architectures via Predicate Abstraction , 2013, Haifa Verification Conference.
[7] Christel Baier,et al. Principles of model checking , 2008 .
[8] Otmane Aït Mohamed,et al. Efficient multilevel formal analysis and estimation of design vulnerability to Single Event Transients , 2015, 2015 IEEE 21st International On-Line Testing Symposium (IOLTS).
[9] Sara Blanc,et al. Enhancement of Fault Injection Techniques Based on the Modification of VHDL Code , 2008, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[10] Sanjit A. Seshia,et al. Design as you see FIT: System-level soft error analysis of sequential circuits , 2009, 2009 Design, Automation & Test in Europe Conference & Exhibition.
[11] Hiroyuki Ochi,et al. Breadth-first manipulation of very large binary-decision diagrams , 1993, Proceedings of 1993 International Conference on Computer Aided Design (ICCAD).
[12] Yvon Savaria,et al. Characterizing, modeling, and analyzing soft error propagation in asynchronous and synchronous digital circuits , 2015, Microelectron. Reliab..
[13] Randal E. Bryant,et al. Efficient implementation of a BDD package , 1991, DAC '90.
[14] Diana Marculescu,et al. MARS-S: Modeling and Reduction of Soft Errors in Sequential Circuits , 2007, 8th International Symposium on Quality Electronic Design (ISQED'07).
[15] Yvon Savaria,et al. New Insights Into the Single Event Transient Propagation Through Static and TSPC Logic , 2014, IEEE Transactions on Nuclear Science.
[16] Xiaodong Li,et al. SoftArch: an architecture-level tool for modeling and analyzing soft errors , 2005, 2005 International Conference on Dependable Systems and Networks (DSN'05).