Mixed-signal BIST using correlation and reconfigurable hardware (poster paper)

ReducingtheareaoverheadrequiredbyBISTstructures canbeachievedby reconfiguringexistinghardware to perform test related control and processingfunctions. This work showshow the resour ces required for theseoperations can be implementedin-circuit, taking advantageof programmablelogic availablein thesystem.Structural and functional testsare performedusingcorrelation to obtain and cross-corr elation signatures, and to measure gain,phase,andtotal harmonicdistortion.