Eddy current arrays for wheel inspection

Wheel inspections are routine and very time-consuming, especially for large aircraft wheels where a single-coil probe is moved manually taking precious long minutes. Eddy current arrays can decrease the inspection time by reducing to one the number of rotations needed to completely cover the wheel surface. Since the EC array probe fits the profile of the wheel, manipulation is easy and the lift-off is kept constant improving signal quality. C-scan displays assist the analysis and help locate the defect by dividing the inspected wheel surface into a small grid. Furthermore, the impedance plane and the strip chart, for all the channels used to build the C-scan, are accessible to provide better sizing accuracy of the defect.