论文信息 - Ultrasonic TOFD flaw sizing and imaging in thin plates using embedded signal identification technique (ESIT)

Ultrasonic TOFD flaw sizing and imaging in thin plates using embedded signal identification technique (ESIT)

The ultrasonic Time-of-Flight Diffraction (TOFD) technique is a well developed technique for sizing defects in thick sections (thickness >10 mm). Attempt has been made here to extend this technique for thin sections (6-10mm). An automated defect sizing algorithm using the Embedded Signal Identification Technique (ESIT) was developed for separating partially superimposed signals often encountered in thin sections and the results were compared with the manual sizing method. Both EDM notches and more realistic fatigue cracks in thin section were used to evaluate the proposed technique.

Krishnan Balasubramaniam | C. Lakshmana Rao | C. V. Krishnamurthy | G. Baskaran

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