Empirical Study on the Burn-in Time of SDRAM Products

[1]  Francis Pascual,et al.  Accelerated life test planning with independent lognormal competing risks , 2010 .

[2]  Luis Ferreira,et al.  Optimal burn-in time under cumulative free replacement warranty , 2002, Reliab. Eng. Syst. Saf..

[3]  Way Kuo,et al.  A nonparametric Bayes approach to decide system burn‐in time , 1997 .

[4]  Chao-Ton Su,et al.  Determination of the optimal burn-in time and cost using an environmental stress approach: a case study in switch mode rectifier , 2002, Reliab. Eng. Syst. Saf..

[5]  K. N. Kim Optimal burn-in for minimizing cost and multiobjectives , 1998 .

[6]  Bong-Jin Yum,et al.  A dual burn-in policy for defect-tolerant memory products using the number of repairs as a quality indicator , 2008, Microelectron. Reliab..

[7]  Dong Shang Chang Optimal burn-in decision for products with an unimodal failure rate function , 2000, Eur. J. Oper. Res..

[8]  Lawrence M. Leemis,et al.  Component vs. system burn-in techniques for electronic equipment , 1989 .

[9]  Jie Mi Bathtub failure rate and upside-down bathtub mean residual life , 1995 .

[10]  M. Fotuhi-Firuzabad,et al.  Customer choice of reliability in spinning reserve procurement and cost allocation , 2008, 2008 IEEE Canada Electric Power Conference.

[11]  J. A. Nachlas,et al.  Coordinated warranty and burn-in strategies , 1997 .

[12]  D. N. P. Murthy,et al.  Optimal Burn-in Time to Minimize Cost for Products Sold Under Warranty , 1982 .

[13]  Loon Ching Tang,et al.  Planning sequential constant-stress accelerated life tests with stepwise loaded auxiliary acceleration factor , 2010 .

[14]  Kwei Tang,et al.  Burn‐in Time and Estimation of Change‐Point with Weibull‐Exponential Mixture Distribution* , 1992 .

[15]  Ali Peiravi,et al.  Accelerated Life Testing Based on Proportional Mean Residual Life Model for Multiple Failure Modes , 2008 .

[16]  Chin-Yu Huang,et al.  Optimal resource allocation for cost and reliability of modular software systems in the testing phase , 2006, J. Syst. Softw..

[17]  Jang Hee Lee,et al.  Adaptive burn-in time decision system based on pattern recognition for intelligent reliability control , 2008, Expert Syst. Appl..

[18]  Charles S. Whitman Accelerated life test calculations using the method of maximum likelihood: an improvement over least squares , 2003, Microelectron. Reliab..

[19]  Shey-Huei Sheu,et al.  Optimal burn-in time to minimize the cost for general repairable products sold under warranty , 2005, Eur. J. Oper. Res..