Mismatch circuit aging modeling and simulations for robust product design and pre-/post-silicon verification
暂无分享,去创建一个
[1] David Burnett,et al. Statistical threshold-voltage variation and its impact on supply-voltage scaling , 1995, Advanced Lithography.
[2] A. Asenov. Simulation of Statistical Variability in Nano MOSFETs , 2007, 2007 IEEE Symposium on VLSI Technology.
[3] B. Woolery,et al. Effect of BTI Degradation on Transistor Variability in Advanced Semiconductor Technologies , 2008, IEEE Transactions on Device and Materials Reliability.
[4] S. Rauch. The statistics of NBTI-induced V/sub T/ and /spl beta/ mismatch shifts in pMOSFETs , 2002 .
[5] M. Agostinelli,et al. PMOS NBTI-induced circuit mismatch in advanced technologies , 2004 .