Identification of different phases in barriers of interface-engineered ramp-edge Josephson junctions: Formation mechanisms and influences on electrical properties
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Keiichi Tanabe | Hironori Wakana | Seiji Adachi | Yoshinobu Tarutani | Yoshihiro Ishimaru | K. Tanabe | Y. Tarutani | S. Adachi | Y. Ishimaru | H. Wakana | Y. Wu | Y. Wu
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