An empirical method for imaging the short circuit current density in silicon solar cells based on dark lock-in thermography

Abstract The most straightforward way to map the photo-induced short circuit current density ( J sc ) in solar cells is light beam-induced current (LBIC) mapping. Recently several methods for J sc imaging based on camera-based photoluminescence and illuminated lock-in thermography imaging were proposed. This letter reports an alternative method for J sc imaging, which is solely based on the evaluation of dark lock-in thermography images. This method is particularly advantageous to improve the accuracy of dark lock-in thermography based local efficiency analysis of solar cells.

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