Recent photonics activities under the NASA Electronic Parts and Packaging (NEPP) program

With the rapidly increasing insertion of photonic devices, circuits and subsystems into NASA spacecraft, a variety of issues associated with reliability and radiation tolerance have arisen. In this paper, we discuss these issues from the perspective of the work currently ongoing in the NASA Electronic Parts and Packaging (NEPP) Program. This Program is focused on evaluating the reliability and radiation response of advanced and emerging microelectronics and photonics technologies of interest to NASA spacecraft system designers. Examples to be discussed include radiation studies of various optoelectronic devices and reliability of photonic components. These studies have been motivated in part by problems observed in space that include the failure of optocouplers on TOPEX/Poseidon, and the observation of single event-induced transients in the Hubble Space Telescope.

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