Flanking stencil method for the detection of impact craters

Detection of the topographical pattern is a challenging area in the field of astronomy and atmospheric science. An improvement is required, in the existing algorithms for the detection of topographical patterns because of the pattern complexity and detection rate. From the satellite, daily about 500 images are transmitted to ground station with resolution ranging from 5-100 meters. The transmission and processing time is important while considering huge volume of data. This paper deals with a novel framework, the flanking stencil method, over the conventional template matching, which provides a competent reduction in execution time. This lightweight framework can be utilized to eliminate the data, during the time of image acquisition which reduces data transmission time and increase in detection rate by using optimum templates. In this approach, the priority of template image, time reduction for comparison between the input image and template image are considered. The storage of coordinates will be useful, so that the coordinate comparison need not be done again. The same method is used here, for the detection of low and high intensity region with the help of different categories of templates. This algorithm includes transformation generator which generates transformed images based on the priority.