Circuit-width based heuristic for Boolean reasoning

Binary decision diagram (BDD) and Boolean satisfiability (SAT) are two common techniques of logic circuit-based Boolean reasoning. Since circuit-width is a good measure of circuit complexity, in this paper, a circuit-width based heuristic for Boolean reasoning is presented, it can be used for integrating the BDD-based engine and SAT-based engine, and takes advantages of both engines. Thus this heuristic can avoid the potential memory explosion during constructing the BDDs, and can prevent the time-out phenomenon of SAT techniques. Compared with the previous heuristics, the proposed heuristic can save more computational resources, and can improve the performance of Boolean reasoning algorithms. This heuristic has been applied in combinational circuit test generation successfully. Experimental results show that, the proposed heuristic can be used for the Boolean reasoning with multiple engines efficiently.

[1]  Carl Sechen,et al.  An efficient method for generating exhaustive test sets , 1995, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[2]  Robert K. Brayton,et al.  Combinational test generation using satisfiability , 1996, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[3]  D. Brand Verification of large synthesized designs , 1993, Proceedings of 1993 International Conference on Computer Aided Design (ICCAD).

[4]  Harry Foster Applied Boolean Equivalence Verification and RTL Static Sign-Off , 2001, IEEE Des. Test Comput..

[5]  Sharad Malik,et al.  Chaff: engineering an efficient SAT solver , 2001, Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232).

[6]  Shi-Yu Huang,et al.  Formal Equivalence Checking and Design Debugging , 1998 .

[7]  Tracy Larrabee,et al.  Test pattern generation using Boolean satisfiability , 1992, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[8]  Kurt Keutzer,et al.  Why is ATPG easy? , 1999, DAC '99.

[9]  Dong Wang,et al.  Using cutwidth to improve symbolic simulation and Boolean satisfiability , 2001, Sixth IEEE International High-Level Design Validation and Test Workshop.

[10]  Robert K. Brayton,et al.  Using SAT for combinational equivalence checking , 2001, Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001.

[11]  Jerry R. Burch,et al.  Tight integration of combinational verification methods , 1998, ICCAD.

[12]  Andreas Kuehlmann,et al.  Equivalence checking combining a structural SAT-solver, BDDs, and simulation , 2000, Proceedings 2000 International Conference on Computer Design.

[13]  Kenneth L. McMillan,et al.  Symbolic model checking: an approach to the state explosion problem , 1992 .

[14]  C. Leonard Berman,et al.  Circuit width, register allocation, and ordered binary decision diagrams , 1991, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..