Comprehensive SRAM design methodology for RTN reliability

In this paper, a comprehensive design flow for achieving reliable SRAMs against random telegraph noise (RTN) is presented. The tailing information of RTN amplitude distributions is important for guardbanding, and can be directly extracted from SRAM test results. Monte Carlo simulation is in excellent agreement with the measurements, and can be used for detailed design. A simple extrapolation method for intuitive understanding of long term RTN impact is also proposed.