Radiation Hardening by the Modification of Shallow Trench Isolation Process in Partially Depleted SOI MOSFETs
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Bin Li | Yunfei En | Zhiyuan Hu | Zhengxuan Zhang | Zhifeng Lei | Zhangang Zhang | Chao Peng | Yiqiang Chen | B. Li | Zhengxuan Zhang | Y. En | C. Peng | Zhiyuan Hu | Yiqiang Chen | Z. Lei | Zhangang Zhang | Bin Li
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