Proposal for a new integrated circuit and electronics neutron experiment source at oak ridge national laboratory
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Eugene Normand | Laura Dominik | Michael J. Dion | Phillip Ferguson | E. Normand | P. Ferguson | M. Dion | L. Dominik
[1] James L. Walsh,et al. IBM experiments in soft fails in computer electronics (1978-1994) , 1996, IBM J. Res. Dev..
[2] Shi-Jie Wen,et al. Building a reliable internet core using soft error prone electronics , 2008, 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial.
[3] Eugene Normand,et al. Investigation and Characterization of SEU Effects and Hardening Strategies in Avionics. , 1995 .
[4] E. Normand,et al. Single event upsets in implantable cardioverter defibrillators , 1998 .
[5] E. Normand. Single-event effects in avionics , 1996 .
[6] R. W. Roussin,et al. DABL69: A broad-group neutron/photon cross-section library for defense nuclear applications , 1989 .
[7] C.W. Slayman,et al. Cache and memory error detection, correction, and reduction techniques for terrestrial servers and workstations , 2005, IEEE Transactions on Device and Materials Reliability.
[8] Cheryl J. Dale,et al. A comparison of Monte Carlo and analytic treatments of displacement damage in Si microvolumes , 1994 .
[9] Leif Z. Scheick,et al. TID, SEE and radiation induced failures in advanced flash memories , 2003, 2003 IEEE Radiation Effects Data Workshop.
[10] P.E. Dodd,et al. Neutron-induced soft errors, latchup, and comparison of SER test methods for SRAM technologies , 2002, Digest. International Electron Devices Meeting,.
[11] J. Wilkinson,et al. A cautionary tale of soft errors induced by SRAM packaging materials , 2005, IEEE Transactions on Device and Materials Reliability.
[12] S. Henderson. SPALLATION NEUTRON SOURCE PROGRESS, CHALLENGES AND UPGRADE OPTIONS* , 2008 .