Issues for single-event proton testing of SRAMs
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E. Blackmore | J. Baggio | J.A. Felix | P. Paillet | V. Ferlet-Cavrois | G. L. Hash | P. Tangyunyong | P. Dodd | J. Schwank | M. Shaneyfelt | E. Blackmore | J. Felix | P. Paillet | V. Ferlet-Cavrois | J. Baggio | P. Tangyunyong | J.R. Schwank | M.R. Shaneyfelt | P.E. Dodd | G.L. Hash
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