The impact of interfacial Si contamination on GaN-on-GaN regrowth for high power vertical devices
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David J. Smith | S. Goodnick | R. Nemanich | F. Ponce | Hanxiao Liu | Yuji Zhao | Po-Yi Su | K. Fu | Chi-Yin Cheng | H. Fu | Chen Yang | Tsung-han Yang | Jingan Zhou | Xuguang Deng | Jossue A. Montes | Xin Qi | Prudhvi Peri | Reza Vatan Meidanshahi | Kevin A. Hatch | D. Messina