Review of methods for in situ leaf area index determination Part I. Theories, sensors and hemispherical photography
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Frédéric Baret | Pol Coppin | Stefan Fleck | Bart Muys | Marie Weiss | Inge Jonckheere | Kris Nackaerts | K. Nackaerts | B. Muys | F. Baret | M. Weiss | I. Jonckheere | P. Coppin | S. Fleck
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