SOI for hostile environment applications
暂无分享,去创建一个
[1] Denis Flandre,et al. Gate-All-Around Technology for Harsh Environment Applications , 1999 .
[2] Jean-Pierre Colinge,et al. Temporal analysis of SEU in SOI/GAA SRAMs , 1995 .
[3] G. Groeseneken,et al. Temperature dependence of threshold voltage in thin-film SOI MOSFETs , 1990, IEEE Electron Device Letters.
[4] W. R. Henderson,et al. High temperature operation of ISE devices and circuits , 1989, IEEE SOS/SOI Technology Conference.
[5] A. H. Johnston,et al. Single-event upset in commercial silicon-on-insulator PowerPC microprocessors , 2002, 2002 IEEE International SOI Conference.