Reusing Component Test Cases for Integration Testing of Retarding Embedded System Components

The integration of retarding components represents a crucial challenge for reusing component test cases for integration testing. Failing to synchronize both test stimulation and test evaluation easily results in useless test executions missing the actual test objectives. We propose a method for balancing and compensating delays for multi-level test cases. With this approach, reusing component test cases for integration testing becomes possible even in presence of components introducing large delays. It represents a better alternative to test case parameterization.

[1]  Eckard Lehmann Time Partition Testing , 2004 .

[2]  W. Liu,et al.  Wave-pipelining: a tutorial and research survey , 1998, IEEE Trans. Very Large Scale Integr. Syst..

[3]  Stefan Kaiser,et al.  Integrating Test Levels for Embedded Systems , 2009, 2009 Testing: Academic and Industrial Conference - Practice and Research Techniques.

[4]  Hiroaki Kobayashi,et al.  Gain Based Delay Balancing in the Deep Submicron Era , 2008 .