In-bulk and surface structuring of sapphire by femtosecond pulses

The actual space-time dependent intensity distribution of a tightly-focused (numerical aperture NA = 1.35) Gaussian femtosecond pulse is modeled inside dielectric material. Such focusing is typically used for recording with sub-wavelength resolution inside dielectrics. The multi-pulse structuring inside the bulk and on the surface of sapphire are demonstrated. Formation of nano-cracks and nano-crystals is revealed inside the crystalline sapphire. Ripple formation on the surface is discussed in terms of the ecacy map calculated by theory given in J. E. Sipe et al., Phys. Rev. B, 27, 1141 (1983).