Reliability of microsystems based on a failure mechanism approach

Compactness, complexity of the interconnections and specific packaging, which are characteristics of Microsystems (MEMS), rule out the use of statistical procedure to assess reliability in space applications. Predictable reliability is the method recommended in this paper that uses a similar approach as CALCE already did for hybrid and microelectronic circuits. This method based on a failure mechanism approach is recalled at first and an example to illustrate this procedure based on the evolution of material crystal properties under radiation is presented.