论文信息 - Atomic force microscopy measurement of the Young’s modulus and hardness of single LaB6 nanowires

Atomic force microscopy measurement of the Young’s modulus and hardness of single LaB6 nanowires

We have employed the atomic force microscopy based (a) three-point bending and (b) nanoindentation methods to obtain the Young’s modulus and hardness of single LaB6 nanowires. The Young’s modulus, E=467.1±15.8GPa, is the same as that of the LaB6 single crystals but larger than the sintered polycrystalline LaB6 samples. The nanoindentation hardness of the LaB6 nanowire is H=70.6±2.1GPa at an indent depth of 4.6nm, which is higher than that of the LaB6 single crystals, LaB6 polycrystals, and W metals. A superior resistance against thermal vibration, field modification, and ion bombardment is expected for the LaB6 nanowires as a field-emission point electron source.

Lin Zhang | L. Qin | Jie Tang | B. An | Han Zhang

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