Tests for single-port and two-port SRAMs

In Chapter 5, realistic fault models have been introduced for two-port (2P) memories, based on defect injection and SPICE simulation; they are divided into single-port faults and unique faults in 2P memories. Inductive fault analysis has also been used in order to determine the importance of the introduced fault models. The results show that in order to reach a high fault coverage, new tests have to be developed for the detection of unique faults in 2P memories.