Noise Modeling Based on Self-Consistent Surface-Potential Description for Advanced MOSFETs aiming at RF Applications
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H.J. Mattausch | S. Kumashiro | T. Ohguro | M. Miura-Mattausch | T. Iizuka | M. Taguchi | S. Miyamoto | M. Miyake | N. Sadachika | T. Ezaki | T. Warabino | D. Navarro
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