Light Effects on the Bias Stability of Transparent ZnO Thin Film Transistors
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Sang-Hee Ko Park | Chi-Sun Hwang | Chun-Won Byun | Woo-Seok Cheong | Hye Yong Chu | Ji-Su Lee | Jae-Heon Shin | Min-Ki Ryu | Jeong Ik Lee | C. Hwang | H. Chu | J. Lee | C. Byun | S. Park | M. Ryu | W. Cheong | Jae‐heon Shin | Jisu Lee | Chi-Sun Hwang
[1] Jaewoo Kyung,et al. 68.2: 3.5 Inch QCIF+ AM‐OLED Panel Based on Oxide TFT Backplane , 2007 .
[2] J. Wager,et al. Transparent Electronics , 2003, Science.
[3] P. Heremans,et al. Correlation between bias stress instability and phototransistor operation of pentacene thin-film transistors , 2007 .
[4] R. B. M. Cross,et al. Investigating the stability of zinc oxide thin film transistors , 2006 .
[5] Michael S. Shur,et al. Physics of amorphous silicon based alloy field‐effect transistors , 1984 .
[6] John F. Muth,et al. Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors , 2008 .
[7] M. J. Powell. The physics of amorphous-silicon thin-film transistors , 1989 .
[8] H. Ohta,et al. Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors , 2004, Nature.
[9] Wolfgang Kowalsky,et al. The influence of visible light on transparent zinc tin oxide thin film transistors , 2007 .
[10] Chi-Sun Hwang,et al. Characteristics of ZnO Thin Films by Means of Plasma-Enhanced Atomic Layer Deposition , 2006 .