An Efficient BIST (Built-in Self-test) for A/D converters

Abstract A histogram-based built-in self-test (BIST) approach for deriving main characteristic parameters of an analog to digital converter (ADC) such as offset, gain and non-linearities is proposed. The BIST uses a ramp signal as an input signal and two counters as a response analyzer to calculate the derived static parameters. Experimental results show that the proposed method makes the hardware overhead and testing time reduced while detecting any static faults in an ADC.