A novel micro-machining method for the fabrication of thick-film SU-8 embedded micro-channels

In this paper, a novel method to realize embedded micro-channels is presented. The presented technology is based on a direct write technique using proton beams to pattern thick-film SU-8. This proton micro-machining method allows the production of high aspect ratio and complex three-dimensional micro-structures in polymers with aspect ratios of over 100 and 20 using poly(methylmethacrylate) (PMMA) and SU-8 respectively. As the SU-8 is used as a structural material, its mechanical properties have to be characterized. For a start, the Young's modulus of the proton beam exposed SU-8 is determined using a stylus-type load-deflection method. The second part of this paper describes the underlying theory and method used by the author to determine the Young's modulus of the proton beam exposed SU-8. Measurements of the SU-8 micro-structures show that the Young's modulus is dependent on the proton beam exposure dose. An exposure dose of 9.5 nC mm-2 results in an average Young's modulus value of 4.254 GPa.

[1]  Soo Chin Liew,et al.  The National University of Singapore nuclear microscope facility , 1994 .

[2]  T. T. Sheng,et al.  The temperature dependence of stresses in aluminum films on oxidized silicon substrates , 1978 .

[3]  R. Muller,et al.  Measurement of Young's modulus on microfabricated structures using a surface profiler , 1990, IEEE Proceedings on Micro Electro Mechanical Systems, An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots..

[4]  O. Tabata,et al.  Mechanical property measurements of thin films using load-deflection of composite rectangular membranes , 1989 .

[5]  L.J. Guerin,et al.  Simple and low cost fabrication of embedded micro-channels by using a new thick-film photoplastic , 1997, Proceedings of International Solid State Sensors and Actuators Conference (Transducers '97).

[6]  M. Despont,et al.  SU-8: a low-cost negative resist for MEMS , 1997 .

[7]  R. Pease,et al.  High-performance heat sinking for VLSI , 1981, IEEE Electron Device Letters.

[8]  M. Laudon,et al.  Mechanical characterization of a new high-aspect-ratio near UV-photoresist , 1998 .

[9]  K. Petersen,et al.  Young’s modulus measurements of thin films using micromechanics , 1979 .

[10]  P. Vettiger,et al.  Fabrication process of high aspect ratio elastic structures for piezoelectric motor applications , 1997, Proceedings of International Solid State Sensors and Actuators Conference (Transducers '97).

[11]  S. Sugiyama,et al.  Mechanical property measurements of thin films using load-deflection of composite rectangular membrane , 1989, IEEE Micro Electro Mechanical Systems, , Proceedings, 'An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots'.

[12]  Chang-Jin Kim,et al.  Fabrication of monolithic microchannels for IC chip cooling , 1995, Proceedings IEEE Micro Electro Mechanical Systems. 1995.

[13]  P. McNally,et al.  A comparative study of Pd/Sn/Au, Au/Ge/Au/Ni/Au, Au-Ge/Ni and Ni/Au-Ge/Ni ohmic contacts to n-GaAs , 1998 .

[14]  F. Watt,et al.  Micromachining using deep ion beam lithography , 1997 .

[15]  F. Cocks,et al.  On the thermoelastic properties of hydrogenated amorphous silicon , 1981 .

[16]  D. Tuckerman Heat-transfer microstructures for integrated circuits , 1984 .

[17]  R. Howe,et al.  Microfabricated structures for the in situ measurement of residual stress, Young’s modulus, and ultimate strain of thin films , 1987 .

[18]  William D. Nix,et al.  A method for interpreting the data from depth-sensing indentation instruments , 1986 .

[19]  Stuart Victor Springham,et al.  A high resolution beam scanning system for deep ion beam lithography , 1998 .

[20]  J. Beams,et al.  Mechanical Strength of Thin Films of Metals , 1955 .

[21]  J. E. Hilliard,et al.  Elastic modulus in composition‐modulated copper‐nickel foils , 1983 .

[22]  M. Jakšić,et al.  Energy straggling induced errors in heavy-ion PIXE analysis , 1998 .

[23]  F. Watt,et al.  Micromachining using focused high energy ion beams: Deep Ion Beam Lithography , 1999 .

[24]  W. Oliver,et al.  Hardness measurement at penetration depths as small as 20 nm , 1983 .

[25]  R. Phillips,et al.  Microchannel heat sinks , 1988 .