Slip defect generation on GaAs wafers during high temperature process: a thermoelastic study from a crystallographic viewpoint
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M. Kiyama | T. Takebe | S. Sawada | H. Yoshida | M. Kiyama | H. Mukai | R. Nakai | T. Takebe | M. Tatsumi | M. Kaji | K. Fujita | M. Tatsumi | R. Nakai | M. Kaji | S. Sawada | K. Fujita | H. Yoshida | H. Mukai