Applications of pattern recognition in semiconductor and printed board production
暂无分享,去创建一个
[1] Takafumi Miyatake,et al. An Automatic Position Recognition Technique for LSI Assembly , 1977, IJCAI.
[2] Masakazu Ejiri,et al. A Transistor Wire-Bonding System Utilizing Multiple Local Pattern Matching Techniques , 1976, IEEE Transactions on Systems, Man, and Cybernetics.
[3] Björn Kruse,et al. Distance checking algorithms , 1979 .
[4] D. Nyyssonen. Optical Linewidth Measurements On Wafers , 1978, Other Conferences.
[5] Michihiro Mese,et al. A process for detecting defects in complicated patterns , 1973, Comput. Graph. Image Process..
[6] Robert C. Restrick. An Automatic Optical Printed Circuit Inspection System , 1977, Optics & Photonics.
[7] J.H. Bruning,et al. An automated mask inspection system—AMIS , 1975, IEEE Transactions on Electron Devices.