An AFM-based methodology for measuring axial and radial error motions of spindles

This paper presents a novel atomic force microscopy (AFM)-based methodology for measurement of axial and radial error motions of a high precision spindle. Based on a modified commercial AFM system, the AFM tip is employed as a cutting tool by which nano-grooves are scratched on a flat surface with the rotation of the spindle. By extracting the radial motion data of the spindle from the scratched nano-grooves, the radial error motion of the spindle can be calculated after subtracting the tilting errors from the original measurement data. Through recording the variation of the PZT displacement in the Z direction in AFM tapping mode during the spindle rotation, the axial error motion of the spindle can be obtained. Moreover the effects of the nano-scratching parameters on the scratched grooves, the tilting error removal method for both conditions and the method of data extraction from the scratched groove depth are studied in detail. The axial error motion of 124 nm and the radial error motion of 279 nm of a commercial high precision air bearing spindle are achieved by this novel method, which are comparable with the values provided by the manufacturer, verifying this method. This approach does not need an expensive standard part as in most conventional measurement approaches. Moreover, the axial and radial error motions of the spindle can both be obtained, indicating that this is a potential means of measuring the error motions of the high precision moving parts of ultra-precision machine tools in the future.

[1]  P. Leiderer,et al.  Mapping of plasmonic resonances in nanotriangles , 2013, Beilstein journal of nanotechnology.

[2]  D. Müller,et al.  Multiparametric imaging of biological systems by force-distance curve–based AFM , 2013, Nature Methods.

[3]  M. Aketagawa,et al.  Concurrent measurement method of spindle radial, axial and angular motions using concentric circle grating and phase modulation interferometers , 2014 .

[4]  J. Sader,et al.  Calibration of rectangular atomic force microscope cantilevers , 1999 .

[5]  F. Koenigsberger,et al.  Testing Machine Tools: For the Use of Machine Tool Makers, Users, Inspectors and Plant Engineers , 1978 .

[6]  A. P. Piedade,et al.  Zeta potential, contact angles, and AFM imaging of protein conformation adsorbed on hybrid nanocomposite surfaces. , 2013, ACS applied materials & interfaces.

[7]  Yongda Yan,et al.  Modelling and experimental study of machined depth in AFM-based milling of nanochannels , 2013 .

[8]  Simon S. Park,et al.  Atomic force microscope probe-based nanometric scribing , 2010 .

[9]  Heber Ferreira Franco de Castro,et al.  A method for evaluating spindle rotation errors of machine tools using a laser interferometer , 2008 .

[10]  Sun Tong Two-step method without harmonics suppression in error separation , 1996 .

[11]  O. Ozdemir,et al.  Determining the fiber size of nano structured sepiolite using Atomic Force Microscopy (AFM) , 2010 .

[12]  Sen Yang,et al.  A Multipoint Method for Spindle Error Motion Measurement , 1997 .

[13]  David J. Whitehouse,et al.  Some theoretical aspects of error separation techniques in surface metrology , 1976 .

[14]  Xuesen Zhao,et al.  Effects of Atomic Force Microscope Silicon Tip Geometry on Large-Scale Nanomechanical Modification of the Polymer Surface , 2012 .

[15]  Izhak Etsion,et al.  An improved wedge calibration method for lateral force in atomic force microscopy , 2003 .

[16]  T. Schimmel,et al.  Reversible mechano-electrochemical writing of metallic nanostructures with the tip of an atomic force microscope , 2012, Beilstein journal of nanotechnology.

[17]  R. Ryan Vallance,et al.  Techniques for calibrating spindles with nanometer error motion , 2005 .

[18]  Eric R. Marsh,et al.  A comparison of reversal and multiprobe error separation , 2010 .

[19]  Robert J. Hocken,et al.  Self-Calibration: Reversal, Redundancy, Error Separation, and ‘Absolute Testing’ , 1996 .

[20]  Tao Sun,et al.  Top-down nanomechanical machining of three-dimensional nanostructures by atomic force microscopy. , 2010, Small.

[21]  Atsushi Sakamoto,et al.  Evaluation method to determine radial accuracy of high-precision rotating spindle units , 1995 .

[22]  P. D. Chapman A capacitance based ultra-precision spindle error analyser , 1985 .

[23]  Xuezeng Zhao,et al.  Effect of contact stiffness on wedge calibration of lateral force in atomic force microscopy. , 2007, The Review of scientific instruments.

[24]  James G. Salsbury Implementation of the Estler face motion reversal technique , 2003 .

[25]  Tao Sun,et al.  Fabrication of millimeter scale nanochannels using the AFM tip-based nanomachining method , 2013 .

[26]  Tao Sun,et al.  Effects of scratching directions on AFM-based abrasive abrasion process , 2009 .

[27]  Jen Fin Lin,et al.  Detailed modeling of the adhesion force between an AFM tip and a smooth flat surface under different humidity levels , 2008 .

[28]  Yoon-Chang Park,et al.  Optical measurement of spindle radial motion by Moiré technique of concentric-circle gratings , 1994 .

[29]  Gi-Ja Lee,et al.  Label-free and quantitative evaluation of cytotoxicity based on surface nanostructure and biophysical property of cells utilizing AFM. , 2013, Micron.

[30]  Chung-Feng Jeffrey Kuo,et al.  Scratch direction and threshold force in nanoscale scratching using atomic force microscopes , 2011 .