论文信息 - Process variability analysis of a Si/SiGe HBT technology with greater than 200 GHz performance - 字舞流文

Process variability analysis of a Si/SiGe HBT technology with greater than 200 GHz performance

S. Jeng | B. Jagannathan | M. Khater | F. Pagette | J. Rieh | D. Angell | H. Chen | K. Schonenberg | P. Smith | A. Stricker | D. Ahlgren | G. Freeman | K. Stein | S. Subbanna | A. Joseph