Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability
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Enrico Sangiorgi | G. Meneghesso | M. Meneghini | S. Decoutere | Claudio Fiegna | E. Zanoni | B. Bakeroot | A. Satka | J. Priesol | Elena Fabris | M. Borga | S. Stoffels | N. Posthuma | A.N. Tallarico | J. Zheng | X. Ma | S. Decoutere | A. Tallarico | C. Fiegna | E. Sangiorgi | M. Meneghini | G. Meneghesso | E. Zanoni | N. Posthuma | S. Stoffels | M. Borga | B. Bakeroot | A. Šatka | E. Fabris | J. Priesol | J. Zheng | X. Ma | J. Zheng | X. Ma
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