论文信息 - SPICE simulation of VLSI interconnects modeled by transmission lines with skin effects

SPICE simulation of VLSI interconnects modeled by transmission lines with skin effects

A lossy transmission line with skin effects is modeled as a characteristic 2-port. The characteristic impedance and propagation function, including the skin effect /spl radic/s, are approximated as rational impedances or transfer functions determined analytically with error control.<<ETX>>

Q. Yu | O. Wing

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