Scaling laws for electrical contact resistance with dissimilar materials

This paper attempts to quantify the effects of contaminants on electrical contact resistance. Based on an idealized model, simple and explicit scaling laws for the electrical contact resistance with dissimilar materials are constructed. The model assumes arbitrary resistivity ratios and aspect ratios in the current channels and their contact region, for both Cartesian and cylindrical geometries. The scaling laws have been favorably tested in several limits, and in sample calculations using a numerical simulation code. From the scaling laws and a survey of the huge parameter space, some general conclusions are drawn on the parametric dependence of the contact resistance on the geometry and on the electrical resistivity in different regions.

[1]  Arend Nijhuis,et al.  Change of interstrand contact resistance and coupling loss in various prototype ITER NbTi conductors with transverse loading in the Twente Cryogenic Cable Press up to 40,000 cycles , 2004 .

[2]  Y. Lau,et al.  A higher dimensional theory of electrical contact resistance , 2008, 2008 IEEE International Vacuum Electronics Conference.

[3]  B. Cabon,et al.  Comparison between beryllium-copper and tungsten high frequency air coplanar probes , 1995, Proceedings of 1995 IEEE MTT-S International Microwave Symposium.

[4]  Robert J. Barker,et al.  Modern Microwave and Millimeter-Wave Power Electronics , 2005 .

[5]  Paul G. Slade,et al.  Electrical contacts : principles and applications , 1999 .

[6]  D. Morgan,et al.  Ab initio study of the effects of thin CsI coatings on the work function of graphite cathodes , 2007 .

[7]  Yong Hoon Jang,et al.  Effect of contact statistics on electrical contact resistance , 2003 .

[8]  Qian Wang,et al.  Ballistic Transport in Metallic Nanotubes with Reliable Pd Ohmic Contacts , 2003 .

[9]  H. Klauk,et al.  Contact resistance in organic thin film transistors , 2001 .

[10]  M. Gomez,et al.  Effect of soft metal gasket contacts on contact resistance, energy deposition, and plasma expansion profile in a wire array Z pinch. , 2008, The Review of scientific instruments.

[11]  W. D. de Heer,et al.  Carbon Nanotubes--the Route Toward Applications , 2002, Science.

[12]  R. Gilgenbach,et al.  Metal-oxide-junction, triple point cathodes in a relativistic magnetron. , 2008, The Review of scientific instruments.

[13]  S. Timsit,et al.  Electrical contact resistance: properties of stationary interfaces , 1998, Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238).

[14]  William J. Greig,et al.  Integrated Circuit Packaging, Assembly and Interconnections , 2007 .

[15]  Edmund Taylor Whittaker,et al.  A Course of Modern Analysis , 2021 .

[16]  Gerwin H. Gelinck,et al.  High-performance all-polymer integrated circuits , 2000 .

[17]  A higher dimensional theory of electrical contact resistance , 2009 .

[18]  J. Booske,et al.  Electric field distribution on knife-edge field emitters , 2007 .