Light-emitting diodes based on InP quantum dots in GaP(100)

The growth, fabrication, and device characterization of the light-emitting diodes based on InP quantum-dot within a GaP matrix and on a GaP(100) substrate are described and discussed. The diode structures are grown using gas-source molecular beam epitaxy. Electroluminescence has been measured under a variety of bias conditions and temperatures. A green emission line at about 550 nm appears to result from carrier recombination in the strained InP wetting layer. Carrier recombination in the InP quantum dots results in red emission at about 720 nm.