A RHBD LC-Tank Oscillator Design Tolerant to Single-Event Transients

A single-event transients (SETs) tolerant LC-tank oscillator was designed, simulated, and fabricated using CMOS 90 nm technology. The simulation and experimental results indicate that the bias current of the oscillator greatly affects the SET-tolerance of an LC-tank oscillator. Adding a decoupling resistor to the bias circuit is an effective way to mitigate the effect of SETs to the oscillator. Laser testing and simulation results show significant reduction in the SET-induced amplitude and phase shifts of the VCO output.

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