Electrooptical sampling using 1.55-μm self-seeded semiconductor laser with soliton pulse compression

We report on a compact, reliable and easy to use electrooptic sampling system based on a self-seeded semiconductor laser having a temporal resolution of <1 ps and a shot noise limited sensitivity of 1 mV. With an operating wavelength of 1.55 /spl mu/m and 0.5-ps time jitter of the optical source, it is particularly suited for ultrahigh-speed devices and integrated circuits. For demonstration, results for an ultrafast metal-semiconductor-metal photodetector are presented.