High-accurate optical vector analysis based on optical single-sideband modulation

Most of the efforts devoted to the area of optical communications were on the improvement of the optical spectral efficiency. Varies innovative optical devices are thus developed to finely manipulate the optical spectrum. Knowing the spectral responses of these devices, including the magnitude, phase and polarization responses, is of great importance for their fabrication and application. To achieve high-resolution characterization, optical vector analyzers (OVAs) based on optical single-sideband (OSSB) modulation have been proposed and developed. Benefiting from the mature and highresolution microwave technologies, the OSSB-based OVA can potentially achieve a resolution of sub-Hz. However, the accuracy is restricted by the measurement errors induced by the unwanted first-order sideband and the high-order sidebands in the OSSB signal, since electrical-to-optical conversion and optical-to-electrical conversion are essentially required to achieve high-resolution frequency sweeping and extract the magnitude and phase information in the electrical domain. Recently, great efforts have been devoted to improve the accuracy of the OSSB-based OVA. In this paper, the influence of the unwanted-sideband induced measurement errors and techniques for implementing high-accurate OSSB-based OVAs are discussed.