Direct measurement of critical resolved shear stress of prismatic and basal slip in polycrystalline Ti using high energy X-ray diffraction microscopy
暂无分享,去创建一个
T. Bieler | J. Lind | P. Kenesei | R. Suter | Jun-Sang Park | Leyun Wang | Z. Zheng | H. Phukan | Z. Zheng