Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

We present the results of single event effects testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.

[1]  Martin A. Carts,et al.  Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA , 2010, 2010 IEEE Radiation Effects Data Workshop.

[2]  P. Miesle,et al.  Opportunities for single event and other radiation effects testing and research at the Indiana University Cyclotron Facility , 1996, 1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference.

[3]  Hak Kim,et al.  Heavy Ion SEE Test Report for the Samsung 4Gbit NAND Flash Memory for MMS , 2009 .

[4]  T. Scott,et al.  Application of a pulsed laser for evaluation and optimization of SEU-hard designs , 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).

[5]  Hak S. Kim,et al.  Heavy ion testing at the galactic cosmic ray energy peak , 2009, 2009 European Conference on Radiation and Its Effects on Components and Systems.

[6]  S. Buchner,et al.  Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies , 1994 .

[7]  M.D. Berg,et al.  Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM , 2009, IEEE Transactions on Nuclear Science.

[8]  NASA GSFC,et al.  Heavy Ion SEE Test Report for the Micron 4Gbit NAND Flash Memory for MMS , 2010 .

[9]  R. Koga,et al.  Heavy Ion-Induced Single Event Upsets of Microcircuits; A Summary of the Aerospace Corporation Test Data , 1984, IEEE Transactions on Nuclear Science.

[10]  M. Friendlich,et al.  Effect of Radiation Exposure on the Endurance of Commercial nand Flash Memory , 2009, IEEE Transactions on Nuclear Science.

[11]  C.M. Castaneda.  Crocker Nuclear Laboratory (CNL) radiation effects measurement and test facility , 2001, 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588).