Defect Electronics in SiC and Fabrication of Ultrahigh-Voltage Bipolar Devices
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Gan Feng | Tsunenobu Kimoto | Takafumi Okuda | Jun Suda | Hiroki Miyake | Yusuke Nishi | Hiroki Niwa | T. Kimoto | K. Kawahara | J. Suda | H. Niwa | T. Okuda | Y. Nishi | Koutarou Kawahara | S. Ichikawa | G. Feng | S. Ichikawa | H. Miyake