论文信息 - Testability analysis of analog systems

Testability analysis of analog systems

A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are present. >

Hans G. Kerkhoff | Gertjan J. Hemink | Berend W. Meijer | H. Kerkhoff | G. Hemink

[1] Hans G. Kerkhoff,et al. TASTE: a tool for analog system testability evaluation , 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.

[2] Neeraj Sen,et al. Fault diagnosis for linear systems via multifrequency measurements , 1979 .

[3] Alberto L. Sangiovanni-Vincentelli,et al. A Computational Approach for the Diagnosability of Dynamical Circuits , 1984, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[4] Neeraj Sen. A measure of testability and its application to test point selection , 1977 .

[5] S. Manetti,et al. Multifrequency measurement of testability with application to large linear analog systems , 1986 .

[6] L. H. Goldstein,et al. Controllability/observability analysis of digital circuits , 1978 .