Automatic fault tracing by successive circuit extraction from CAD layout data with the CAD-linked EB test system

We describe the automatic fault tracing of a self-made 8-bit microprocessor by successive circuit extraction from CAD layout data with the CAD-linked EB test system. The origin of the marginal fault demonstrated by the shmoo plot was automatically localized. The number of probing points was 26. The total time required for fault tracing was 53 minutes.

[1]  Bernard Courtois,et al.  An integrated debugging system based on E-beam test , 1988 .

[2]  M. Marzouki,et al.  Fully automatic VLSI diagnosis in a CAD-linked E-beam probing system , 1988 .

[3]  Hideo Todokoro,et al.  E-beam fault diagnosis system for logic VLSIs , 1992 .

[4]  Wojciech Maly,et al.  VLSI Design for Manufacturing: Yield Enhancement , 1989 .

[5]  Bernard Courtois,et al.  Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing , 1986, ITC.

[6]  Katsuyoshi Miura,et al.  Hierarchical VLSI Fault Tracing by Successive Circuit Extraction from CAD Layout Data in the CAD-Linked EB Test System , 1997, J. Electron. Test..

[7]  Alan C. Noble.  IDA: A TOOL FOR COMPUTER-AIDED FAILURE ANALYSIS , 1992, Proceedings International Test Conference 1992.

[8]  Arthur Hu,et al.  New approach to integrate LSI design databases with e-beam tester , 1990, Proceedings. International Test Conference 1990.

[9]  K. Miura.  Automatic tracing of transistor-level performance faults with CAD-linked electron beam test system , 1994 .

[10]  Katsuyoshi Miura,et al.  A New Approach for VLSI Testing with CAD-Linked Electron Beam Test System , 1995 .

[11]  L. Marton,et al.  Advances in Electronics and Electron Physics , 1958 .

[12]  Katsuyoshi Miura,et al.  Automatic EB fault tracing system by successive circuit extraction from VLSI CAD layout data , 1997, Proceedings Sixth Asian Test Symposium (ATS'97).

[13]  H. Fujioka,et al.  Electron Beam Testing , 1989 .