Transport and Noise Properties of sub-100-nm Planar Nb Josephson Junctions with Metallic Hf - Ti Barriers for nano-SQUID Applications
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D. Koelle | J. Beyer | T. Schurig | A. Zorin | R. Kleiner | T. Weimann | O. Kieler | M. Martínez-Pérez | B. Müller | V. Morosh | J. Linek | S. Wolter