1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses
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Nathalie Labat | André Touboul | Cristell Maneux | Jean Godin | Muriel Riet | S. Blayac | J. C. Martin | M. Kahn
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Nathalie Labat | André Touboul | Cristell Maneux | Jean Godin | Muriel Riet | S. Blayac | J. C. Martin | M. Kahn