Thin film characterization by atomic force microscopy at ultrasonic frequencies

We present a technique in which atomic force microscopy at ultrasonic frequencies is used to determine the thickness of thin films. In this technique, the resonance frequency of a flexural mode of an atomic force microscope cantilever is used to determine the tip-sample contact stiffness. This allows the film thickness to be determined, provided that the tip and sample elastic moduli and radii of curvature are known. We report experimental results for thin metal and polymer films deposited on silicon substrates and compare them with the predictions of a theoretical model.