A low-cost SEU fault emulation platform for SRAM-based FPGAs

In this paper, we introduce a fully automated low cost hardware/software platform for efficiently performing fault emulation experiments targeting SEUs in the configuration bits of FPGA devices, without the need for expensive radiation experiments. We propose a method for significantly reducing the fault list by removing the faults on unused LUT bit positions. We also target the design flip-flops found in the configurable logic blocks (CLBs) inside the FPGA. Run-time reconfigurability of Virtex devices using JBits is exploited to provide the means not only for fault injection but fault detection as well. First, we consider five possible application scenarios for evaluating different self-test schemes. Then, we apply the least favorite and most time consuming of these scenarios on two 32times32 multiplier designs, demonstrating that transferring the simulation processing workload to FPGA hardware can allow for acceleration of simulation time of more than two orders of magnitude