Investigations on the Geometry Effects and Bias Configuration on the TID Response of nMOS SOI Tri-Gate Nanowire Field-Effect Transistors
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O. Faynot | M. Martinez | F. Andrieu | M. Vinet | P. Paillet | S. Barraud | C. Marcandella | M. Gaillardin | M. Raine | O. Duhamel | N. Richard | T. Lagutere | J. Riffaud