论文信息 - Combining Advanced Photoelectron Spectroscopy Approaches to Analyse Deeply Buried Gap(As)/Si(100) Interfaces: Interfacial Chemical States and Complete Band Energy Diagrams - 字舞流文

Combining Advanced Photoelectron Spectroscopy Approaches to Analyse Deeply Buried Gap(As)/Si(100) Interfaces: Interfacial Chemical States and Complete Band Energy Diagrams

W. Jaegermann | A. Gloskovskii | J. Hofmann | C. Schlueter | C. Hartmann | T. Hannappel | R. Félix | R. Wilks | O. Romanyuk | A. Paszuk | I. Gordeev | M. Bar | J. Houdková | S. Ueda | I. Bartovs | M. Nandy | P. Jivr'ivcek