Simulation studies and modeling of Short Circuit current oscillations in IGBTs

During Short-Circuit (SC) operations, strong current oscillations of IGBTs can appear. Simulation studies also confirm this. No parasitic inductances are required for such oscillations. A simplified equivalent circuit of the device, which is basically an RC oscillator, is able to reproduce the oscillations. The occurrence of oscillations depends on the model parameters, which can be related to the device structure and other conditions such as the gate resistance value, gate biasing, and DC-link voltage. This paper also shows that application of basic system theory methods to AC small-signal device simulation results (frequency-domain analysis under small-signal conditions) is appropriate to analyze the stability range of the IGBT under Short-Circuit.

[1]  W. Fichtner,et al.  Oscillation effects in IGBT's related to negative capacitance phenomena , 1999 .

[2]  T. Laska,et al.  The Field Stop IGBT (FS IGBT). A new power device concept with a great improvement potential , 2000, 12th International Symposium on Power Semiconductor Devices & ICs. Proceedings (Cat. No.00CH37094).

[3]  U. Schlapbach,et al.  Limitation of the short-circuit ruggedness of high-voltage IGBTs , 2009, 2009 21st International Symposium on Power Semiconductor Devices & IC's.

[4]  Kenneth C. Smith,et al.  Microelectronic Circuits Revised Edition , 2007 .

[5]  P. Kanschat,et al.  Short circuit properties of Trench-/Field-Stop-IGBTs-design aspects for a superior robustness , 2003, ISPSD '03. 2003 IEEE 15th International Symposium on Power Semiconductor Devices and ICs, 2003. Proceedings..

[6]  I. Omura,et al.  IGBT negative gate capacitance and related instability effects , 1997, IEEE Electron Device Letters.

[7]  A. Sedra Microelectronic circuits , 1982 .

[8]  Kwang-Hoon Oh,et al.  Investigation of short-circuit failure limited by dynamic-avalanche capability in 600-V punchthrough IGBTs , 2006, IEEE Transactions on Device and Materials Reliability.